Semi-Automatic Prober for Power Device Evaluation AX-2500
A new semi-automatic prober focused on the electrical characteristic evaluation of vertical/horizontal structured power devices.
This is a high-precision semi-automatic prober capable of handling wafer sizes up to 8 inches. Its low-noise specifications allow it to accommodate various applications. It supports automatic measurement.
- Company：ベクターセミコン
- Price：Other
